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A study of the interfacial resistive switching mechanism by proton exchange reactions on the SiO(x) layer. | LitMetric
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A study of the interfacial resistive switching mechanism by proton exchange reactions on the SiO(x) layer.

Fei Zhou Yao-Feng Chang Ying-Chen Chen Xiaohan Wu Ye Zhang Burt Fowler Jack C Lee

Phys Chem Chem Phys

Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, USA.

Published: January 2016

In this work, we investigated SiO(x)-based interfacial resistive switching in planar metal-insulator-metal structures using physical/chemical/electrical analyses. This work helps clarify the interfacial reaction process and mechanism in SiO(x), and also shows the potential for high temperature operation in future nonvolatile memory applications.

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 Source
http://dx.doi.org/10.1039/c5cp06507kDOI Listing

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