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| http://dx.doi.org/10.1021/jz500406n | DOI Listing |
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Scattering Elimination in 2D IR Immune from Detector Artifacts.
J Phys Chem B
September 2024
Department of Chemistry, University of California, Irvine, California 92697-2025, United States.
Highly scattering samples, such as polymer droplets or solid-state powders, are difficult to study via coherent two-dimensional infrared (2D IR) spectroscopy. Previously, researchers have employed (quasi-) phase cycling, local-oscillator chopping, and polarization control to reduce scattering, but the latter method poses a limit on polarization-dependent measurements. Here, we present a method for Scattering Elimination Immune from Detector Artifacts (SEIFDA) in pump-probe 2D IR experiments.
View Article and Find Full Text PDFHigh temporal resolution is essential for ultra-fast pump-probe experiments. Arrival time jitter and drift measurements, as well as their control, become critical especially when combining XUV or X-ray free-electron lasers (FELs) with optical lasers due to the large scale of such facilities and their distinct pulse generation processes. This paper presents the application of a laser pulse arrival time monitor that actively corrects the arrival time of an optical laser relative to the FEL's main optical clock.
View Article and Find Full Text PDFCorrelation of refractive index based and THz streaking arrival time tools for a hard X-ray free-electron laser.
J Synchrotron Radiat
March 2024
SwissFEL, Paul Scherrer Institute, 5232 Villigen, Switzerland.
To fully exploit ultra-short X-ray pulse durations routinely available at X-ray free-electron lasers to follow out-of-equilibrium dynamics, inherent arrival time fluctuations of the X-ray pulse with an external perturbing laser pulse need to be measured. In this work, two methods of arrival time measurement were compared to measure the arrival time jitter of hard X-ray pulses. The methods were photoelectron streaking by a THz field and a transient refractive index change of a semiconductor.
View Article and Find Full Text PDFAngle-resolved photoelectron spectroscopy in a low-energy electron microscope.
Struct Dyn
November 2023
ELMITEC Elektronenmikroskopie GmbH, 38678 Clausthal-Zellerfeld, Germany.
Spectroscopic photoemission microscopy is a well-established method to investigate the electronic structure of surfaces. In modern photoemission microscopes, the electron optics allow imaging of the image plane, momentum plane, or dispersive plane, depending on the lens setting. Furthermore, apertures allow filtering of energy-, real-, and momentum space.
View Article and Find Full Text PDFOptical Saturation Produces Spurious Evidence for Photoinduced Superconductivity in K_{3}C_{60}.
Phys Rev Lett
April 2023
Department of Physics, Simon Fraser University, Burnaby, British Columbia V5A 1S6, Canada.
We discuss a systematic error in time-resolved optical conductivity measurements that becomes important at high pump intensities. We show that common optical nonlinearities can distort the photoconductivity depth profile, and by extension distort the photoconductivity spectrum. We show evidence that this distortion is present in existing measurements on K_{3}C_{60}, and describe how it may create the appearance of photoinduced superconductivity where none exists.
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