AI Article Synopsis
- The study examines bimetallic nanoparticle growth at a single particle level, providing insights that traditional ensemble measurements might miss.
- Single particle spectroscopy is used to observe changes in the scattering spectra of Au-Cu alloy nanorods, revealing that atomic-level geometric defects are responsible for unique spectral features.
- Electrodynamics simulations confirm that small defects create additional scattering peaks, demonstrating that single particle scattering is as effective as high-resolution electron microscopy for detecting these defects.
Article Abstract
A single particle level study of bimetallic nanoparticle growth provides valuable information that is usually hidden in ensemble measurements, helping to improve the understanding of a reaction mechanism and overcome the synthetic challenges. In this study, we use single particle spectroscopy to monitor the changes in the scattering spectra of Au-Cu alloy nanorods during growth. We found that the unique features of the single particle scattering spectra were due to atomic level geometric defects in the nanorods. Electrodynamics simulations have demonstrated that small structural defects of a few atomic layers split the scattering peaks, giving rise to higher order modes, which do not exist in defect-free rods of similar geometry. The study shows that single particle scattering technique is as sensitive as high-resolution electron microscopy in revealing atomic level structural defects.
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| http://dx.doi.org/10.1039/c5nr03979g | DOI Listing |
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