Power-recycled weak-value-based metrology.

Phys Rev Lett

Department of Physics, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801-3080, USA.

Published: May 2015

We improve the precision of the interferometric weak-value-based beam deflection measurement by introducing a power recycling mirror, creating a resonant cavity. This results in all the light exiting to the detector with a large deflection, thus eliminating the inefficiency of the rare postselection. The signal-to-noise ratio of the deflection is itself magnified by the weak value. We discuss ways to realize this proposal, using a transverse beam filter and different cavity designs.

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http://dx.doi.org/10.1103/PhysRevLett.114.170801DOI Listing

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The weak-value-based metrology is very promising and has attracted a lot of attention in recent years because of its remarkable ability in signal amplification. However, it is suggested that the upper limit of the precision of this metrology cannot exceed that of classical metrology because of the low sample size caused by the probe loss during postselection. Nevertheless, a recent proposal shows that this probe loss can be reduced by the power-recycling technique, and thus enhance the precision of weak-value-based metrology.

View Article and Find Full Text PDF

We improve the precision of the interferometric weak-value-based beam deflection measurement by introducing a power recycling mirror, creating a resonant cavity. This results in all the light exiting to the detector with a large deflection, thus eliminating the inefficiency of the rare postselection. The signal-to-noise ratio of the deflection is itself magnified by the weak value.

View Article and Find Full Text PDF

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