AI Article Synopsis

  • The proposed tunneling field-effect transistor (TFET) utilizes a heteromaterial (HM) gate for optimal performance in both low standby power (LSTP) applications and high-speed scenarios.
  • The simulations demonstrated that the HM-gate TFET enhances subthreshold characteristics and tunneling probability by effectively modifying the metal workfunction difference between the source-side and drain-side gates.
  • Additionally, the HM-gate design results in lower gate capacitance, leading to improved cut-off frequency and reduced intrinsic delay time, confirming its effectiveness for both power efficiency and high-frequency operations.

Article Abstract

We propose a tunneling field-effect transistor (TFET) with a heteromaterial (HM)-gate not only for low standby power (LSTP) applications, which TFETs are genuinely suitable for, but also for high-speed performance by properly adjusting intrinsic gate capacitance (C(gg)). As a result of simulations in this work, the HM-gate TFET showed better subthreshold characteristics (smaller S) at an appropriate threshold voltage (V(th)) for LSTP applications, enhancing tunneling probability by modulating the difference in the metal workfunction (φ(m)) between the source-side gate (S-gate) and the drain-side gate (D-gate). Further, the C(gg) of HM-gate TFET were extracted and compared against that of conventional TFETs having gates with various φ(m)'s. Since lower C(gg) can be formed by high φ(m) in the D-gate, the HM-gate TFET has an excellent cut-off frequency (f(T)) and intrinsic delay time (τ) associated with the C(gg). We confirmed that the HM-gate TFET proposed in this work achieves superb performance for LSTP applications as well as high-frequency operations.

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Source
http://dx.doi.org/10.1166/jnn.2014.9882DOI Listing

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Article Synopsis
  • The proposed tunneling field-effect transistor (TFET) utilizes a heteromaterial (HM) gate for optimal performance in both low standby power (LSTP) applications and high-speed scenarios.
  • The simulations demonstrated that the HM-gate TFET enhances subthreshold characteristics and tunneling probability by effectively modifying the metal workfunction difference between the source-side and drain-side gates.
  • Additionally, the HM-gate design results in lower gate capacitance, leading to improved cut-off frequency and reduced intrinsic delay time, confirming its effectiveness for both power efficiency and high-frequency operations.
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