The ALBA spectroscopic LEEM-PEEM experimental station: layout and performance.

J Synchrotron Radiat

ALBA Synchrotron Light Facility, Carretera BP 1413, Km. 3.3, Cerdanyola del Vallès, Barcelona 08290, Spain.

Published: May 2015

The spectroscopic LEEM-PEEM experimental station at the CIRCE helical undulator beamline, which started user operation at the ALBA Synchrotron Light Facility in 2012, is presented. This station, based on an Elmitec LEEM III microscope with electron imaging energy analyzer, permits surfaces to be imaged with chemical, structural and magnetic sensitivity down to a lateral spatial resolution better than 20 nm with X-ray excited photoelectrons and 10 nm in LEEM and UV-PEEM modes. Rotation around the surface normal and application of electric and (weak) magnetic fields are possible in the microscope chamber. In situ surface preparation capabilities include ion sputtering, high-temperature flashing, exposure to gases, and metal evaporation with quick evaporator exchange. Results from experiments in a variety of fields and imaging modes will be presented in order to illustrate the ALBA XPEEM capabilities.

Download full-text PDF

Source
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC4416685PMC
http://dx.doi.org/10.1107/S1600577515003537DOI Listing

Publication Analysis

Top Keywords

spectroscopic leem-peem
8
leem-peem experimental
8
experimental station
8
alba spectroscopic
4
station layout
4
layout performance
4
performance spectroscopic
4
station circe
4
circe helical
4
helical undulator
4

Similar Publications

The ALBA spectroscopic LEEM-PEEM experimental station: layout and performance.

J Synchrotron Radiat

May 2015

ALBA Synchrotron Light Facility, Carretera BP 1413, Km. 3.3, Cerdanyola del Vallès, Barcelona 08290, Spain.

The spectroscopic LEEM-PEEM experimental station at the CIRCE helical undulator beamline, which started user operation at the ALBA Synchrotron Light Facility in 2012, is presented. This station, based on an Elmitec LEEM III microscope with electron imaging energy analyzer, permits surfaces to be imaged with chemical, structural and magnetic sensitivity down to a lateral spatial resolution better than 20 nm with X-ray excited photoelectrons and 10 nm in LEEM and UV-PEEM modes. Rotation around the surface normal and application of electric and (weak) magnetic fields are possible in the microscope chamber.

View Article and Find Full Text PDF

Want AI Summaries of new PubMed Abstracts delivered to your In-box?

Enter search terms and have AI summaries delivered each week - change queries or unsubscribe any time!