Tunable Ultraviolet Photoresponse in Solution-Processed p-n Junction Photodiodes Based on Transition-Metal Oxides.

ACS Appl Mater Interfaces

†Materials Science and Engineering Division, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States.

Published: May 2015

Solution-processed p-n heterojunction photodiodes have been fabricated based on transition-metal oxides in which NiO and ternary Zn(1-x)Mg(x)O (x = 0-0.1) have been employed as p-type and n-type semiconductors, respectively. Composition-related structural, electrical, and optical properties are also investigated for all the films. It has been observed that the bandgap of Zn(1-x)Mg(x)O films can be tuned between 3.24 and 3.49 eV by increasing Mg content. The fabricated highly visible-blind p-n junction photodiodes show an excellent rectification ratio along with good photoresponse and quantum efficiency under ultraviolet (UV) illumination. With an applied reverse bias of 1 V and depending on the value of x, the maximum responsivity of the devices varies between 0.22 and 0.4 A/W and the detectivity varies between 0.17 × 10(12) and 2.2 × 10(12) cm (Hz)(1/2)/W. The photodetectors show an excellent UV-to-visible rejection ratio. Compositional nonuniformity has been observed locally in the alloyed films with x = 0.1, which is manifested in photoresponse and X-ray analysis data. This paper demonstrates simple solution-processed, low cost, band tunable photodiodes with excellent figures of merit operated under low bias.

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http://dx.doi.org/10.1021/acsami.5b01420DOI Listing

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