The Dark Side of EDX Tomography: Modeling Detector Shadowing to Aid 3D Elemental Signal Analysis.

Microsc Microanal

Department of Materials Science and Metallurgy, University of Cambridge,27 Charles Babbage Road,Cambridge,CB3 0FS,UK.

Published: June 2015

A simple model is proposed to account for the loss of collected X-ray signal by the shadowing of X-ray detectors in the scanning transmission electron microscope. The model is intended to aid the analysis of three-dimensional elemental data sets acquired using energy-dispersive X-ray tomography methods where shadow-free specimen holders are unsuitable or unavailable. The model also provides a useful measure of the detection system geometry.

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Source
http://dx.doi.org/10.1017/S1431927615000227DOI Listing

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