Fly-scan ptychography.

Sci Rep

National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA.

Published: March 2015

We report an experimental ptychography measurement performed in fly-scan mode. With a visible-light laser source, we demonstrate a 5-fold reduction of data acquisition time. By including multiple mutually incoherent modes into the incident illumination, high quality images were successfully reconstructed from blurry diffraction patterns. This approach significantly increases the throughput of ptychography, especially for three-dimensional applications and the visualization of dynamic systems.

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http://www.ncbi.nlm.nih.gov/pmc/articles/PMC4357920PMC
http://dx.doi.org/10.1038/srep09074DOI Listing

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