In the context of remote sensing, the reflectance of snow is a key factor for accurate inversion for snow properties, such as snow grain size, albedo, because of it is influenced by the change of snow properties. The polarized reflectance is a general phenomenon during the reflected progress in natural incident light In this paper, based on the correct measurements for the multiple-angle reflected property of snow field in visible and near infrared wavelength (from 350 to 2,500 nm), the influence of snow grain size and wet snow on the bidirectional polarized property of snow was measured and analyzed. Combining the results measured in the field and previous conclusions confirms that the relation between polarization and snow grain size is obvious in infrared wavelength (at about 1,500 nm), which means the degree of polarization increasing with an increase of snow grain size in the forward scattering direction, it is because the strong absorption of ice near 1,500 nm leads to the single scattering light contributes to the reflection information obtained by the sensor; in other word, the larger grain size, the more absorption accompanying the larger polarization in forward scattering direction; we can illustrate that the change from dry snow to wet snow also influences the polarization property of snow, because of the water on the surface of snow particle adheres the adjacent particles, that means the wet snow grain size is larger than the dry snow grain size. Therefore, combining the multiple-angle polarization with reflectance will provide solid method and theoretical basis for inversion of snow properties.
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Nat Commun
December 2024
Davidson School of Chemical Engineering, Purdue University, West Lafayette, IN, USA.
Metal halide perovskites show promise for next-generation light-emitting diodes, particularly in the near-infrared range, where they outperform organic and quantum-dot counterparts. However, they still fall short of costly III-V semiconductor devices, which achieve external quantum efficiencies above 30% with high brightness. Among several factors, controlling grain growth and nanoscale morphology is crucial for further enhancing device performance.
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College of Food Science and Engineering, Wuhan Polytechnic University, Wuhan, Hubei, P. R. China.
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View Article and Find Full Text PDF3D Print Addit Manuf
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School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan, P.R. China.
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December 2024
School of Food Science and Engineering, Jilin Agricultural University, Changchun 130118, PR China; Scientific Research Base of Edible Mushroom Processing Technology Integration of Ministry of Agriculture and Rural Affairs, Changchun 130118, China. Electronic address:
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December 2024
Guangdong Provincial Key Laboratory of Electronic Functional Materials and Devices, Huizhou University, Huizhou 516007, China.
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