InGaN/GaN light-emitting diode structures with Al-coated GaN nanorods were fabricated by using soft ultraviolet nanoimprint lithography. The intensity of light emission was found to be greatly enhanced due to the strong near-fields confined at the interface of Al/GaN and extended to the multiple quantum wells (MQWs) active region. The dynamics of carrier recombination and plasmon-enhanced Raman scattering were also investigated, providing a progressive view on the effective energy transfer between MQWs and surface plasmons.
Download full-text PDF |
Source |
---|---|
http://dx.doi.org/10.1088/0957-4484/26/12/125201 | DOI Listing |
Enter search terms and have AI summaries delivered each week - change queries or unsubscribe any time!