Exposure Reconstruction and Risk Analysis for Six Semiconductor Workers With Lymphohematopoietic Cancers.

J Occup Environ Med

From ENVIRON International Corporation (Dr Jones, Ms Simmons, and Ms Boelter) and School of Public Health, University of Illinois at Chicago (Dr Jones); ENVIRON International Corporation (Ms Dell), Amherst, MA; ENVIRON International Corporation (Mr Torres), Atlanta, GA; ENVIRON International Corporation (Dr Poole), Tampa, FL; and ENVIRON International Corporation (Mr Harper), Phoenix, AZ. Ms Simmons is currently employed by Simmons Environmental and Occupational Health Solutions. Mr Torres is currently employed by Gates Rubber.

Published: June 2015

Objective: To investigate whether workplace exposures to recognized lymphohematopoietic carcinogens were possibly related to cancers in six semiconductor-manufacturing workers.

Methods: A job-exposure matrix was developed for chemical and physical process agents and anticipated by-products. Potential cumulative occupational exposures of the six cases were reconstructed. The role of workplace exposures in cancer was evaluated through quantitative risk assessment and by comparison with epidemiological literature.

Results: Two workers were potentially exposed to agents capable of causing their diagnosed cancers. Reconstructed exposures were similar to levels in outdoor environments and lower than exposures associated with increased risks in epidemiological studies. Cancer risks were estimated to be less than 1 in 10,000 persons.

Conclusions: The development of cancer among the six workers was unlikely to be explained by occupational exposures to recognized lymphohematopoietic carcinogens.

Download full-text PDF

Source
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC4448668PMC
http://dx.doi.org/10.1097/JOM.0000000000000413DOI Listing

Publication Analysis

Top Keywords

workplace exposures
8
exposures recognized
8
recognized lymphohematopoietic
8
lymphohematopoietic carcinogens
8
occupational exposures
8
exposures
6
exposure reconstruction
4
reconstruction risk
4
risk analysis
4
analysis semiconductor
4

Similar Publications

Want AI Summaries of new PubMed Abstracts delivered to your In-box?

Enter search terms and have AI summaries delivered each week - change queries or unsubscribe any time!