We demonstrate a new, label-free, far-field super-resolution method based on an ultrafast pump-probe scheme oriented toward nanomaterial imaging. A focused pump laser excites a diffraction-limited spatial temperature profile, and the nonlinear changes in reflectance are probed. Enhanced spatial resolution is demonstrated with nanofabricated silicon and vanadium dioxide nanostructures. Using an air objective, resolution of 105 nm was achieved, well beyond the diffraction limit for the pump and probe beams and offering a novel kind of dedicated nanoscopy for materials.
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