Improving the lateral resolution of quartz tuning fork-based sensors in liquid by integrating commercial AFM tips into the fiber end.

Sensors (Basel)

Departamento de Física de la Materia Condensada, C-3, Universidad Autónoma de Madrid, Cantoblanco, 28049 Madrid, Spain.

Published: January 2015

The use of quartz tuning fork sensors as probes for scanning probe microscopy is growing in popularity. Working in shear mode, some methods achieve a lateral resolution comparable with that obtained with standard cantilevered probes, but only in experiments conducted in air or vacuum. Here, we report a method to produce and use commercial AFM tips in electrically driven quartz tuning fork sensors operating in shear mode in a liquid environment. The process is based on attaching a standard AFM tip to the end of a fiber probe which has previously been sharpened. Only the end of the probe is immersed in the buffer solution during imaging. The lateral resolution achieved is about 6 times higher than that of the etched microfiber on its own.

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Source
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC4327093PMC
http://dx.doi.org/10.3390/s150101601DOI Listing

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