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Dislocation luminescence in GaN single crystals under nanoindentation. | LitMetric

Dislocation luminescence in GaN single crystals under nanoindentation.

Nanoscale Res Lett

Suzhou Institute of Nano-tech and Nano-bionics, CAS, Suzhou 215123, People's Republic of China ; Suzhou Nanowin Science and Technology Co., Ltd., Suzhou 215123, People's Republic of China.

Published: January 2015

This work presents an experimental study on the dislocation luminescence in GaN by nanoindentation, cathodoluminescence, and Raman. The dislocation luminescence peaking at 3.12 eV exhibits a series of special properties in the cathodoluminescence measurements, and it completely disappears after annealing at 500°C. Raman spectroscopy shows evidence for existence of vacancies in the indented region. A comprehensive investigation encompassing cathodoluminescence, Raman, and annealing experiments allow the assignment of dislocation luminescence to conduction-band-acceptor transition involving Ga vacancies. The nanoscale plasticity of GaN can be better understood by considering the dislocation luminescence mechanism.

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Source
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC4275118PMC
http://dx.doi.org/10.1186/1556-276X-9-649DOI Listing

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