We have recently reported a 980nm GaAs-based three terminal Pnp transistor-vertical-cavity surface-emitting laser (TVCSEL) operating at room temperature with optical power up to 1.8mW. However, the current gain β = ΔIc/ΔIb was near zero just before lasing and became negative after the lasing threshold. The main cause of the negative current gain was found to be a gradual and position-dependent forward-biasing (saturation) of the base-collector junction with increasing bias even before lasing threshold. In this article, detailed multi-physics device simulations are performed to better understand the device physics, and find ways to avoid the premature saturation of the base-collector junction. We have optimized the thickness of the base region as well as its doping concentration and the location of the quantum wells to ensure that the T-VCSEL is in the active mode throughout its range of operation. That is, the emitter-base junction is forward biased and base-collector junction is reversed biased for sweeping the excess charges out of the base region.
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http://dx.doi.org/10.1364/OE.22.027398 | DOI Listing |
Micromachines (Basel)
June 2024
Institute of Semiconductors, Guangdong Academy of Sciences, Guangzhou 510650, China.
This research explores the architecture and efficacy of GaN/AlGaN-based heterojunction phototransistors (HPTs) engineered with both a compositionally graded and a doping-graded base. Employing theoretical analysis along with empirical fabrication techniques, HPTs configured with an aluminum compositionally graded base were observed to exhibit a substantial enhancement in current gain. Specifically, theoretical models predicted a 12-fold increase, while experimental evaluations revealed an even more pronounced improvement of approximately 27.
View Article and Find Full Text PDFMicromachines (Basel)
April 2024
School of Nuclear Science and Technology, Xi'an Jiaotong University, Xi'an 710049, China.
The single-event effects (SEEs) of frequency divider circuits and the radiation tolerance of the hardened circuit are studied in this paper. Based on the experimental results of SEEs in InP HBTs, a transient current model for sensitive transistors is established, taking into account the influence of factors such as laser energy, base-collector junction voltage, and radiation position. Moreover, the SEEs of the (2:1) static frequency divider circuit with the InP DHBT process are simulated under different laser energies by adding the transient current model at sensitive nodes.
View Article and Find Full Text PDFNanomaterials (Basel)
April 2024
State Key Laboratory of Optoelectronic Materials and Technologies, Guangdong Province Key Laboratory of Display Material and Technology, School of Electronics and Information Technology, Sun Yat-sen University, Guangzhou 510275, China.
Two-dimensional (2D) materials have attracted great attention in the past few years and offer new opportunities for the development of high-performance and multifunctional bipolar junction transistors (BJTs). Here, a van der Waals BJT based on vertically stacked n-MoS/WSe/MoS was demonstrated. The electrical performance of the device was investigated under common-base and common-emitter configurations, which show relatively large current gains of α ≈ 0.
View Article and Find Full Text PDFMicromachines (Basel)
November 2023
Key Laboratory for Wide Band Gap Semiconductor Materials and Devices of Education Ministry, School of Microelectronics, Xidian University, Xi'an 710071, China.
In this paper, the reliability of InP/InGaAs DHBTs under high reverse base-collector bias stress is analyzed by experiments and simulation. The DC characteristics and S parameters of the devices under different stress times were measured, and the key parameters with high field stress were also extracted to fully understand and analyze the high-field degradation mechanism of devices. The measurements indicate that the high-field stress leads to an increase in base current, an increase in base-collector (B-C) and base-emitter (B-E) junction leakage current, and a decrease in current gain, and different degrees of degradation of key parameters over stress time.
View Article and Find Full Text PDFHeliyon
October 2019
Laboratoire de Mécanique et de Modélisation des Systèmes, L2MS, Department of Physics, Faculty of Science, University of Dschang, P.O.Box 67, Dschang, Cameroon.
A simple driven bipolar junction transistor (BJT) based two-component circuit is presented, to be used as didactic tool by Lecturers, seeking to introduce some elements of complex dynamics to undergraduate and graduate students, using familiar electronic components to avoid the traditional black-box consideration of active elements. Although the effect of the base-emitter (BE) junction is practically suppressed in the model, chaotic phenomena are detected in the circuit at high frequencies (HF), due to both the reactant behavior of the second component, a coil, and to the birth of parasitic capacitances as well as to the effect of the weak nonlinearity from the base-collector (BC) junction of the BJT, which is otherwise always neglected to the favor of the predominant but now suppressed base-emitter one. The behavior of the circuit is analyzed in terms of stability, phase space, time series and bifurcation diagrams, Lyapunov exponents, as well as frequency spectra and Poincaré map section.
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