Invited article: Characterization of background sources in space-based time-of-flight mass spectrometers.

Rev Sci Instrum

International Space Science Institute, Hallerstrasse 6, CH-3012 Bern, Switzerland and Physikalisches Institut, Universität Bern, Sidlerstrasse 5, CH-3012 Bern, Switzerland.

Published: September 2014

For instruments that use time-of-flight techniques to measure space plasma, there are common sources of background signals that evidence themselves in the data. The background from these sources may increase the complexity of data analysis and reduce the signal-to-noise response of the instrument, thereby diminishing the science value or usefulness of the data. This paper reviews several sources of background commonly found in time-of-flight mass spectrometers and illustrates their effect in actual data using examples from ACE-SWICS and MESSENGER-FIPS. Sources include penetrating particles and radiation, UV photons, energy straggling and angular scattering, electron stimulated desorption of ions, ion-induced electron emission, accidental coincidence events, and noise signatures from instrument electronics. Data signatures of these sources are shown, as well as mitigation strategies and design considerations for future instruments.

Download full-text PDF

Source
http://dx.doi.org/10.1063/1.4894694DOI Listing

Publication Analysis

Top Keywords

background sources
8
time-of-flight mass
8
mass spectrometers
8
sources background
8
sources
6
data
5
invited article
4
article characterization
4
background
4
characterization background
4

Similar Publications

Want AI Summaries of new PubMed Abstracts delivered to your In-box?

Enter search terms and have AI summaries delivered each week - change queries or unsubscribe any time!