Scanning focused refractive-index microscopy.

Sci Rep

Key Laboratory of Weak-Light Nonlinear Photonics, Ministry of Education, School of physics and TEDA Applied Physics School, Nankai University, Tianjin 300071, China.

Published: July 2014

AI Article Synopsis

  • The novel scanning focused refractive-index microscopy (SFRIM) technique combines focused laser light, the derivative total reflection method, and scanning to accurately obtain refractive index profiles.
  • SFRIM achieves an impressive resolution of 1 µm and an accuracy of 0.002, successfully measuring materials like cedar oil and a gradient-refractive-index lens, confirming its reliability.
  • This technique opens new avenues for applications in fields such as optical waveguides, photorefractive studies, and biomedical imaging, allowing analysis of scattering and absorbing samples.

Article Abstract

We present a novel scanning focused refractive-index microscopy (SFRIM) technique to obtain the refractive index (RI) profiles of objects. The method uses a focused laser as the light source, and combines the derivative total reflection method (DTRM), projection magnification, and scanning technique together. SFRIM is able to determine RIs with an accuracy of 0.002, and the central spatial resolution achieved is 1 µm, which is smaller than the size of the focal spot. The results of measurements carried out on cedar oil and a gradient-refractive-index (GRIN) lens agree well with theoretical expectations, verifying the accuracy of SFRIM. Furthermore, using SFRIM, to the best of our knowledge we have extracted for the first time the RI profile of a periodically modulated photosensitive gelatin sample. SFRIM is the first RI profile-resolved reflected light microscopy technique that can be applied to scattering and absorbing samples. SFRIM enables the possibility of performing RI profile measurements in a variety of applications, including optical waveguides, photosensitive materials and devices, photorefractive effect studies, and RI imaging in biomedical fields.

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Source
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC4090626PMC
http://dx.doi.org/10.1038/srep05647DOI Listing

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