AI Article Synopsis
- Researchers demonstrated a new hard x-ray microscopy technique that enables both absorption and phase contrast imaging using a regular lab x-ray source.
- The system includes two crossed planar waveguides that function as a small secondary source, allowing for high-resolution imaging.
- They successfully showcased both scanning and full-field imaging modes, achieving a resolution of about 2 μm, and provided examples using thin metal grids and glass micro-spheres to validate their approach.
Article Abstract
We report on the experimental demonstration of a hard x-ray microscopy scheme achieving absorption and phase contrast imaging with a standard laboratory source. The x-ray optical system features two crossed planar waveguides coupled to the primary source. The dual waveguide acts as a secondary micron-sized source, enabling high imaging resolution. Both scanning and full-field imaging modes are demonstrated with the same experimental system, with a resolution of about 2 μm in scanning mode. Examples of absorption, differential phase and retrieved phase depth of thin metal grids and glass micro-spheres are reported as proof of concept of the technique.
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| http://dx.doi.org/10.1364/OE.22.015437 | DOI Listing |
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