AI Article Synopsis
- Atom-probe tomography (APT) is a powerful technique that offers detailed analysis of grain boundaries at the atomic level but struggles with capturing larger features due to its small sample size.
- A new method combines transmission electron microscopy (TEM) with focused-ion-beam (FIB) techniques to accurately select and extract mesoscale features from bulk samples for APT analysis.
- This approach has been successfully used to extract a prior austenite grain boundary in martensitic steel and is applicable to other structural features like interfaces, precipitates, and crack tips.
Article Abstract
Atom-probe tomography (APT) provides atomic-scale spatial and compositional resolution that is ideally suited for the analysis of grain boundaries. The small sample volume analyzed in APT presents, however, a challenge for capturing mesoscale features, such as grain boundaries. A new site-specific method utilizing transmission electron microscopy (TEM) for the precise selection and isolation of mesoscale microstructural features in a focused-ion-beam (FIB) microscope lift-out sample, from below the original surface of the bulk sample, for targeted preparation of an APT microtip by FIB-SEM microscopy is presented. This methodology is demonstrated for the targeted extraction of a prior austenite grain boundary in a martensitic steel alloy; it can, however, be easily applied to other mesoscale features, such as heterophase interfaces, precipitates, and the tips of cracks.
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| http://dx.doi.org/10.1016/j.ultramic.2014.05.005 | DOI Listing |
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