AI Article Synopsis
- Sb2Te3 films are utilized to explore the alignment between 2D materials and 3D substrates, focusing on their structural compatibility.
- The development of coincidence lattices between Sb2Te3 and Si(111) is significantly affected by the surface geometry and dangling bonds on the Si(111) substrate.
- The research demonstrates that manipulating the Si(111) surface reconstruction can influence the epitaxial relationship, especially in ultrathin film applications.
Article Abstract
Sb2Te3 films are used for studying the epitaxial registry between two-dimensionally bonded (2D) materials and three-dimensional bonded (3D) substrates. In contrast to the growth of 3D materials, it is found that the formation of coincidence lattices between Sb2Te3 and Si(111) depends on the geometry and dangling bonds of the reconstructed substrate surface. Furthermore, we show that the epitaxial registry can be influenced by controlling the Si(111) surface reconstruction and confirm the results for ultrathin films.
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| http://dx.doi.org/10.1021/nl5011492 | DOI Listing |
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