We measured the in situ polarization-dependent X-ray absorption fine structure of platinum nanoparticles (PtNPs) deposited on a flat highly oriented pyrolytic graphite (HOPG) substrate under electrochemical conditions using a back-side illumination method. In this method, the thin HOPG substrate with PtNPs deposited on one side was used as a window for incident and fluorescent X-rays, as well as an electrode. A bent crystal Laue analyzer (BCLA) was applied to the extraction of the Pt Lα fluorescent X-ray signals from strong scattered X-rays. Pt L3 edge XAFS spectra were observed for various electrode potentials and polarization directions.
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