AI Article Synopsis

  • The study focuses on the cold-field emission properties of carbon cone nanotips (CCnTs), using a transmission electron microscope (TEM) for in situ analysis.
  • The relationship between current and voltage was examined and analyzed with the Fowler-Nordheim (F-N) equation, while off-axis electron holography mapped the electric field around the nanotip.
  • Results indicated a local electric field of 2.55 V/nm at a tip-anode distance of 680 nm and a work function of 4.8±0.3 eV for the CCnT was determined.

Article Abstract

Cold-field emission properties of carbon cone nanotips (CCnTs) have been studied in situ in the transmission electron microscope (TEM). The current as a function of voltage, i(V), was measured and analyzed using the Fowler-Nordheim (F-N) equation. Off-axis electron holography was employed to map the electric field around the tip at the nanometer scale, and combined with finite element modeling, a quantitative value of the electric field has been obtained. For a tip-anode separation distance of 680 nm (measured with TEM) and a field emission onset voltage of 80 V, the local electric field was 2.55 V/nm. With this knowledge together with recorded i(V) curves, a work function of 4.8±0.3 eV for the CCnT was extracted using the F-N equation.

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http://dx.doi.org/10.1016/j.micron.2014.03.005DOI Listing

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