AI Article Synopsis
- Depth resolved X-ray photoelectron spectroscopy (XPS) and a 25 μm liquid jet were used to study the distribution of 3 nm SnO2 nanoparticles in a liquid suspension.
- The findings indicate there is a distinct layer at the air-water interface that is free of these nanoparticles, extending several nanometers thick.
- This technique helps quantify how nanoparticles migrate from the air-water interface into the bulk of the suspension.
Article Abstract
Depth resolved X-ray photoelectron spectroscopy (XPS) combined with a 25 μm liquid jet is used to quantify the spatial distribution of 3 nm SnO2 nanoparticles (NPs) from the air-water interface (AWI) into the suspension bulk. Results are consistent with those of a layer several nm thick at the AWI that is completely devoid of NPs.
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| http://dx.doi.org/10.1039/c4cc00720d | DOI Listing |
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