A transmission ellipsometric method has been reformed without a spatial filtering aperture to characterize electro-optic (EO) performance of EO polymers. This method affords much simpler optical setup compared to the reflection method, and lets us easily perform detailed incident angle dependence measurements using a conventional glass substrate and an un-collimated beam. It is demonstrated that the reliable characterization with this method is possible in combination with a simple data analysis. By using the recently matured deposition technique of indium zinc oxide (IZO) on soft materials, it is possible to prepare the EO polymer sandwiched between two transparent electrodes. Thus the transmission method should be re-evaluated.
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We report a significant improvement in the measurement accuracy of electro-optic (EO) coefficients for low-loss EO polymers on substrates of sol-gel silica and indium tin oxide (ITO). Initially, we apply the standard Teng and Man reflection ellipsometric method, which results in substantial variability in the measured EO coefficients across a wavelength spectrum with changes as small as <1 nm. This variance leads to unreliable EO coefficient values ranging from a few to 70 pm/V at the 1.
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