Spatially controlled fabrication of a bright fluorescent nanodiamond-array with enhanced far-red Si-V luminescence.

Nanotechnology

Center for Nanoscale Materials and Biointegration (CNMB), University of Alabama at Birmingham, Birmingham, 35294-1170, USA. Department of Physics, University of Alabama at Birmingham, Birmingham, 35294-1170, USA.

Published: January 2014

We demonstrate a novel approach to precisely pattern fluorescent nanodiamond-arrays with enhanced far-red intense photostable luminescence from silicon-vacancy (Si-V) defect centers. The precision-patterned pre-growth seeding of nanodiamonds is achieved by a scanning probe 'dip-pen' nanolithography technique using electrostatically driven transfer of nanodiamonds from 'inked' cantilevers to a UV-treated hydrophilic SiO2 substrate. The enhanced emission from nanodiamond dots in the far-red is achieved by incorporating Si-V defect centers in a subsequent chemical vapor deposition treatment. The development of a suitable nanodiamond ink and mechanism of ink transport, and the effect of humidity and dwell time on nanodiamond patterning are investigated. The precision patterning of as-printed (pre-CVD) arrays with dot diameter and dot height as small as 735 nm ± 27 nm and 61 nm ± 3 nm, respectively, and CVD-treated fluorescent ND-arrays with consistently patterned dots having diameter and height as small as 820 nm ± 20 nm and, 245 nm ± 23 nm, respectively, using 1 s dwell time and 30% RH is successfully achieved. We anticipate that the far-red intense photostable luminescence (~738 nm) observed from Si-V defect centers integrated in spatially arranged nanodiamonds could be beneficial for the development of next generation fluorescence-based devices and applications.

Download full-text PDF

Source
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC3956127PMC
http://dx.doi.org/10.1088/0957-4484/25/4/045302DOI Listing

Publication Analysis

Top Keywords

si-v defect
12
defect centers
12
enhanced far-red
8
far-red intense
8
intense photostable
8
photostable luminescence
8
dwell time
8
height small
8
spatially controlled
4
controlled fabrication
4

Similar Publications

First-Principles Investigation of Near-Surface Divacancies in Silicon Carbide.

Nano Lett

December 2023

Pritzker School of Molecular Engineering, University of Chicago, Chicago, Illinois 60637, United States.

The realization of quantum sensors using spin defects in semiconductors requires a thorough understanding of the physical properties of the defects in the proximity of surfaces. We report a study of the divacancy (VV) in 3C-SiC, a promising material for quantum applications, as a function of surface reconstruction and termination with -H, -OH, -F and oxygen groups. We show that a VV close to hydrogen-terminated (2 × 1) surfaces is a robust spin-defect with a triplet ground state and no surface states in the band gap and with small variations of many of its physical properties relative to the bulk, including the zero-phonon line and zero-field splitting.

View Article and Find Full Text PDF

Tuning a small electron polaron in FePO by P-site or O-site doping based on DFT+ and KMC simulation.

Phys Chem Chem Phys

March 2023

School of Advanced Materials, Peking University, Shenzhen Graduate School, Shenzhen 518055, People's Republic of China.

Due to the existence of a small polaron, the intrinsic electronic conductivity of olivine-structured LiFePO is quite low, limiting its performance as a cathode material for lithium-ion batteries (LIBs). Previous studies have mainly focused on improving intrinsic conductivity through Fe-site doping while P-site or O-site doping has rarely been reported. Herein, we studied the formation and dynamics of the small electron polaron in FePXO and FePOZ by employing the density functional theory with the on-site Hubbard correction terms (DFT+) and Kinetic Monte Carlo (KMC) simulation, where X and Z indicate the doping elements (X = S, Se, As, Si, V; Z = S, F, Cl), and and β indicate the light doping at the P position ( = 0.

View Article and Find Full Text PDF

A Multi-Scale Simulation Study of Irradiation Swelling of Silicon Carbide.

Materials (Basel)

April 2022

Science and Technology on Reactor System Design Technology Laboratory, Nuclear Power Institute of China, Chengdu 610213, China.

Silicon carbide (SiC) is a promising structural and cladding material for accident tolerant fuel cladding of nuclear reactor due to its excellent properties. However, when exposed to severe environments (e.g.

View Article and Find Full Text PDF

Initial stage of cubic GaN for heterophase epitaxial growth induced on nanoscale v-grooved Si(001) in metal-organic vapor-phase epitaxy.

Nanotechnology

January 2019

Department of Electrical and Computer Engineering and Center for High Technology Materials, University of New Mexico, Albuquerque, NM 87106, United States of America.

The initial stages of the nucleation of cubic (c-) GaN in heterophase epitaxy on a Si v-groove are investigated. Growth of GaN on a nanoscale {111}-faceted v-groove fabricated into a Si(001) substrate proceeds in the hexagonal (h-) phase that induces a secondary v-groove replicating the substrate topography with two opposing {0001} facets. The secondary v-groove is then orientationally mismatched at the junction of the h-GaN facets (h -h junction) resulting in structural instability.

View Article and Find Full Text PDF

Electrically active induced energy levels and metastability of B and N vacancy-complexes in 4H-SiC.

J Phys Condens Matter

May 2018

Department of Physics, University of Pretoria, Pretoria 0002, South Africa. Department of Mathematical and Physical Sciences, Samuel Adegboyega University, Ogwa, Edo State, Nigeria.

Electrically active induced energy levels in semiconductor devices could be beneficial to the discovery of an enhanced p or n-type semiconductor. Nitrogen (N) implanted into 4H-SiC is a high energy process that produced high defect concentrations which could be removed during dopant activation annealing. On the other hand, boron (B) substituted for silicon in SiC causes a reduction in the number of defects.

View Article and Find Full Text PDF

Want AI Summaries of new PubMed Abstracts delivered to your In-box?

Enter search terms and have AI summaries delivered each week - change queries or unsubscribe any time!