AI Article Synopsis
- The study introduces a new type of scanning probe microscope that merges electrically detected magnetic resonance (EDMR) with (photo-)conductive atomic force microscopy ((p)cAFM) for advanced material analysis.
- A specialized X-band microwave resonator is integrated into the AFM, enabling the conductive AFM tips to act as moving contacts for real-time EDMR experiments.
- The system demonstrates high sensitivity, detecting current changes as minimal as 20 fA in amorphous silicon samples, achieving a spin sensitivity of 8×10^6 spins/√Hz at room temperature.
Article Abstract
We present the design and implementation of a scanning probe microscope, which combines electrically detected magnetic resonance (EDMR) and (photo-)conductive atomic force microscopy ((p)cAFM). The integration of a 3-loop 2-gap X-band microwave resonator into an AFM allows the use of conductive AFM tips as a movable contact for EDMR experiments. The optical readout of the AFM cantilever is based on an infrared laser to avoid disturbances of current measurements by absorption of straylight of the detection laser. Using amorphous silicon thin film samples with varying defect densities, the capability to detect a spatial EDMR contrast is demonstrated. Resonant current changes as low as 20 fA can be detected, allowing the method to realize a spin sensitivity of 8×10(6)spins/√Hz at room temperature.
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| http://dx.doi.org/10.1063/1.4827036 | DOI Listing |
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