We introduce a method to objectively evaluate systems of differing beam deflection technologies that commonly are described by disparate technical specifications. Using our new approach based on resolvable spots we will compare commercially available random-access beam deflection technologies, namely galvanometer scanners, piezo scanners, MEMS scanners, acousto-optic deflectors, and electro-optic deflectors.
Download full-text PDF |
Source |
|---|---|
| http://dx.doi.org/10.1364/OL.38.002934 | DOI Listing |
Publication Analysis
Top Keywords
beam deflection
12
deflection technologies
12
resolvable spots
8
evaluation disparate
4
disparate laser
4
laser beam
4
technologies number
4
number rate
4
rate resolvable
4
spots introduce
4
Similar Publications
Want AI Summaries of new PubMed Abstracts delivered to your In-box?
Enter search terms and have AI summaries delivered each week - change queries or unsubscribe any time!