Severity: Warning
Message: file_get_contents(https://...@pubfacts.com&api_key=b8daa3ad693db53b1410957c26c9a51b4908&a=1): Failed to open stream: HTTP request failed! HTTP/1.1 429 Too Many Requests
Filename: helpers/my_audit_helper.php
Line Number: 176
Backtrace:
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 176
Function: file_get_contents
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 250
Function: simplexml_load_file_from_url
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 1034
Function: getPubMedXML
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 3152
Function: GetPubMedArticleOutput_2016
File: /var/www/html/application/controllers/Detail.php
Line: 575
Function: pubMedSearch_Global
File: /var/www/html/application/controllers/Detail.php
Line: 489
Function: pubMedGetRelatedKeyword
File: /var/www/html/index.php
Line: 316
Function: require_once
Silicon electrochemistry in fluorohydrogenate ionic liquids is partly hampered owing to the incapability of producing an accurate and reproducible potential measurement due to a lack of appropriate reference electrodes. This research work describes a simple assembly of a stable external reference electrode enabling accurate studies of silicon electrochemistry in fluorohydrogenate ionic liquids. The electrode configuration is based on the ferrocene/ferrocenium (Fc|Fc(+)) couple dissolved in the EMIm(HF)(2.3)F (1-ethyl-3-methyl-imidazolium fluorohydrogenate)/Carbopol 941 gel. A stable potential of 2.5 wt% Carbopol-based electrode was measured versus a calomel reference electrode at 250 ± 3 mV. By utilizing the constructed electrode, an intensive electrochemical investigation on n-type silicon in EMIm(HF)(2.3)F was conducted. Flat-band and open circuit potentials were measured, along with Si-air half- and full-cell electrochemical measurements. A suggested mechanism for the n-type Si dissolution process in the EMIm(HF)(2.3)F electrolyte, without illumination, is discussed as well.
Download full-text PDF |
Source |
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http://dx.doi.org/10.1039/c3cp52661e | DOI Listing |
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