AI Article Synopsis
- Third-generation synchrotron radiation X-ray phase-contrast microscopy (XPCM) enhances image edges and allows for high-contrast imaging of low-Z materials due to the unique spatial coherence of X-rays.
- The study analyzed the microstructures of adhesives at the interface and their penetration in wood and bamboo composites using XPCM at the Shanghai Synchrotron Radiation Facility (SSRF).
- Findings suggest that synchrotron radiation XPCM could be a crucial tool for precision detection in wood-based panel manufacturing.
Article Abstract
Third-generation synchrotron radiation X-ray phase-contrast microscopy(XPCM)can be used for obtaining image with edge enhancement, and achieve the high contrast imaging of low-Z materials with the spatial coherence peculiarity of X-rays. In the present paper, the characteristic microstructures of adhesive at the interface and their penetration in wood/bamboo composite material were investigated systematically by XPCM at Shanghai Synchrotron Radiation Facility (SSRF). And the effect of several processing techniques was analyzed for the adhesive penetration in wood/bamboo materials. The results show that the synchrotron radiation XPCM is expected to be one of the important precision detection methods for wood-based panels.
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