AI Article Synopsis
- - Nonspherical probe particles can be effectively used in optically-trapped scanning probe microscopy.
- - The calibration of the trap can be achieved using only position data, eliminating the need to measure the particle's orientation.
- - The method relies on a pseudopotential derived from position occupation probabilities, without needing to assume a linear relationship between force and displacement.
Article Abstract
Nonspherical probe particles are an attractive choice for optically-trapped scanning probe microscopy. We show that it is possible to calibrate a trap with a nonspherical particle using only position measurements, without requiring measurement of orientation, using a pseudopotential based on the position occupation probability. It is not necessary to assume the force is linear with displacement.
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| http://dx.doi.org/10.1364/OL.38.001244 | DOI Listing |
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