Silicon dangling bonds exposed on the monohydride silicon (001) (Si(001):H) surface are highly reactive, thus enabling site-selective absorption of atoms and single molecules into custom patterns designed through the controlled removal of hydrogen atoms. Current implementations of high-resolution hydrogen lithography on the Si(001):H surface rely on sequential removal of hydrogen atoms using the tip of a scanning probe microscope. Here, we present a scalable thermal process that yields very long rows of single dimer wide silicon dangling bonds suitable for self-assembly of atoms and molecules into one-dimensional structures of unprecedented length on Si(001):H. The row consists of the standard buckled Si dimer and an unexpected flat dimer configuration.
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http://dx.doi.org/10.1021/nn4010236 | DOI Listing |
Nanotechnology
January 2025
Department of Physics, University of Alberta, 4-181 CCIS, University of Alberta, Edmonton, Alberta, T6G 2R3, CANADA.
Bare silicon dimers on hydrogen-terminated Si(100) have two dangling bonds. These are atomically localized regions of high state density near to and within the bulk silicon band gap. We studied bare silicon dimers as monomeric units.
View Article and Find Full Text PDFACS Nano
January 2025
Department of Materials Science and Engineering, Ulsan National Institute of Science and Technology, Ulsan 44919, Republic of Korea.
With reduced dimensionality and a high surface area-to-volume ratio, two-dimensional (2D) semiconductors exhibit intriguing electronic properties that are exceptionally sensitive to surrounding environments, including directly interfacing gate dielectrics. These influences are tightly correlated to their inherent behavior, making it critical to examine when extrinsic charge carriers are intentionally introduced to the channel for complementary functionality. This study explores the physical origin of the competitive transition between intrinsic and extrinsic charge carrier conduction in extrinsically -doped MoS, highlighting the central role of interactions of the channel with amorphous gate dielectrics.
View Article and Find Full Text PDFPhys Chem Chem Phys
December 2024
Prokhorov General Physics Institute of the Russian Academy of Sciences, Moscow, Russia.
Dangling bonds (DBs) are common defects in silicon that affect its electronic performance by trapping carriers at the in-gap levels. For probing the electrical properties of individual DBs, a scanning tunneling microscope (STM) is an effective instrument. Here we study transitions between charge states of a single DB on chlorinated and brominated Si(100)-2 × 1 surfaces in an STM.
View Article and Find Full Text PDFACS Appl Mater Interfaces
November 2024
Department of Electrical Engineering, NIT Rourkela, Rourkela 769008, Odisha, India.
Solid-state hydrogen storage outperforms conventional storage methods in terms of safety and on-board applications. Porous Si (PS) is the optimized Si nanostructure with ample surface area (∼400 m g) and maximum dangling sites for hydrogenation. Though solid-state hydrogen storage in Si nanostructures, especially in porous Si, is extensively studied, the thermal desorption of hydrogen is rarely reported.
View Article and Find Full Text PDFNanoscale
October 2024
Department of Technical Physics, University of Eastern Finland, Kuopio, Finland.
Si nanoparticles (NPs) have been actively developed as a hyperpolarized magnetic resonance imaging (MRI) contrast agent with an imaging window close to one hour. However, the progress in the development of NPs has been hampered by the incomplete understanding of their structural properties that correspond to efficient hyperpolarization buildup and long polarization decays. In this work we study dynamic nuclear polarization (DNP) of single crystal porous Si (PSi) NPs with defined doping densities ranging from nominally undoped to highly doped with boron or phosphorus.
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