Influence of line tension on spherical colloidal particles at liquid-vapor interfaces.

Phys Rev Lett

Physics Department, Kansas State University, 116 Cardwell Hall, Manhattan, Kansas 66506 2601, USA.

Published: November 2012

Atomic force microscopy (AFM) imaging of isolated submicron dodecyltrichlorosilane coated silica spheres, immobilized at the liquid polystyrene- (PS-) air interface at the PS glass transition temperature, T(g), allows for determination of the contact angle θ versus particle radius R. At T(g), all θ versus R measurements are well described by the modified Young's equation for a line tension τ = 0.93 nN. The AFM measurements are also consistent with a minimum contact angle θ(min) and minimum radius R(min), below which single isolated silica spheres cannot exist at the PS-air interface.

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http://dx.doi.org/10.1103/PhysRevLett.109.196101DOI Listing

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