AI Article Synopsis
- A new method for measuring thickness using a coherent homodyne CW THz system was introduced, which simplifies the process by only needing accurate scanning rather than precise frequency control.
- A compact dual-mode laser operating at 1.55 μm was created as the optical beat source for this system.
- The proposed method successfully measured sample thickness, highlighting the potential for a practical, cost-effective CW THz system in various applications.
Article Abstract
A simple thickness measurement method based on the coherent homodyne CW THz system was demonstrated; it does not require precise control of the frequencies of the beat source, and only accurate scanning of the optical delay line is needed. Three beat frequencies are sufficient for measuring the thickness of a sample without considering the modulo 2π ambiguity. A novel compact 1.55 μm λ/4 phase-shifted dual-mode laser (DML) was developed as an optical beat source for the CW THz system. The thickness of a sample was accurately estimated from the measurements using the proposed method. Our results clearly show the possibility of a compact, simple, and cost-effective CW THz system for practical applications.
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| http://dx.doi.org/10.1364/OE.20.025990 | DOI Listing |
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