Structure-dependent interatomic dispersion coefficients in oxides with maximally localized Wannier functions.

J Phys Condens Matter

Laboratoire de Spectrochimie Infrarouge et Raman (LASIR), CNRS, Université Lille 1-Sciences et Technologies, F-59655 Villeneuve d'Ascq, France.

Published: November 2012

The interatomic C(6) dispersion coefficients in crystalline and amorphous SiO(2) and ZrO(2) structures were obtained with the approach proposed by Silvestrelli (2008 Phys. Rev. Lett. 100 053002) and based on the use of maximally localized Wannier functions (MLWFs) for partitioning the electron density. Localization of Wannier functions close to the nuclei in oxide systems makes it possible to assign the MLWFs to the atoms in an unambiguous way and then to compute the C(6) coefficients in an atom pairwise manner. A modification of the method is suggested in which the MLWFs are condensed to effective orbitals centred on the atoms and parameters of these effective orbitals are used for computing the interatomic dispersion coefficients. The obtained values of the dispersion coefficients were found to vary not only from one oxide to another, but also between different modifications of the same compound. The oxygen-oxygen coefficient C6(OO) reveals the largest variation and its value in ZrO(2) structures is twice as large as that in SiO(2) ones. Atomic characteristics obtained in the frame of the effective orbital method, such as the self-atom dispersion coefficient, and the oxide ion polarizability were found to correlate with the metal-oxygen bond length and the oxygen coordination number in the systems. This behaviour is attributed to the confinement of electrons by the electrostatic potential. The values of the coefficient and of the polarizability were related to charges of the oxygen atoms. In all studied systems the oxygen atoms having larger absolute values of charge were found to be less polarizable because of a stronger confinement effect. The obtained results can be used in the development of polarizable force fields for the atomistic modelling of oxide materials.

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http://dx.doi.org/10.1088/0953-8984/24/47/475501DOI Listing

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