Effective bias removal for fringe projection profilometry using the dual-tree complex wavelet transform.

Appl Opt

Centre for Signal Processing, Department of Electronic and Information Engineering, The Hong Kong Polytechnic University, Hong Kong, China.

Published: August 2012

When reconstructing the three-dimensional (3D) object height profile using the fringe projection profilometry (FPP) technique, the light intensity reflected from the object surface can yield abruptly changing bias in the captured fringe image, which leads to severe reconstruction error. The traditional approach tries to remove the bias by suppressing the zero spectrum of the fringe image. It is based on the assumption that the aliasing between the frequency spectrum of the bias, which is around the zero frequency, and the frequency spectrum of the fringe is negligible. This, however, is not the case in practice. In this paper, we propose a novel (to our knowledge) technique to eliminate the bias in the fringe image using the dual-tree complex wavelet transform (DT-CWT). The new approach successfully identifies the features of bias, fringe, and noise in the DT-CWT domain, which allows the bias to be effectively extracted from a noisy fringe image. Experimental results show that the proposed algorithm is superior to the traditional methods and facilitates accurate reconstruction of objects' 3D models.

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Source
http://dx.doi.org/10.1364/AO.51.005909DOI Listing

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