Effect of 980-nm diode laser-aided circumferential supracrestal fiberotomy on fluorosed root surfaces.

Objective: To evaluate and compare the root surface morphological changes after 980-nm diode laser-aided circumferential supracrestal fiberotomy (CSF) on fluorosed and non-fluorosed teeth.

Materials And Methods: The sample comprised 27 orthodontic patients (14 males and 13 females; mean age  =  17.3 years) with and without fluorosis, from whom 40 fluorosed and 40 non-fluorosed premolar teeth were extracted for orthodontic reasons. Conventional (control group) and laser-aided (experimental group) CSF was performed on fluorosed and non-fluorosed teeth indicated for orthodontic extraction, using a scalpel and a 980-nm diode laser at 2.5 W power, respectively. Subsequently, teeth were extracted, sectioned, and examined by scanning electron microscope to assess the ultrastructural changes.

Results: There were differences in surface morphology among fluorosed and non-fluorosed roots in the control group. The root specimens of both fluorosed and non-fluorosed teeth irradiated by diode laser exhibited no evidence of smear layer, laser-induced pitting or cavitation, linear cuts/markings, carbonization of surface, and heat-induced surface cracking. However, a glazed or slightly melted appearance was observed in root specimens of fluorosed teeth after diode laser irradiation.

Conclusions: These findings suggest that the diode laser-aided CSF procedure is free from thermal hazard on non-fluorosed root surfaces but may provoke some thermal changes on fluorosed root surfaces.