An improved algorithm for phase-to-height mapping in phase-measuring profilometry (PMP) is proposed, in which the phase-to-height mapping relationship is no longer restricted to the condition that the optical axes of the imaging system must be orthogonal to the reference plane in the basic PMP. Only seven coefficients independent of the coordinate system need to be calibrated, and the system calibration can be accomplished using only two different gauge blocks, instead of more than three different standard planes. With the proposed algorithm, both the phase measurement and system calibration can be completed simultaneously, which makes the three-dimensional (3-D) measurement faster and more flexible. Experiments have verified its feasibility and validity.
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Improved phase-to-height mapping method combine with device attitude.
Sci Rep
April 2024
School of Automation and Information, Xi'an University of Technology, Xi'an, 710048, China.
Phase-to-height mapping is one of the important processes in three dimensional phase measurement profilometry. But, in traditional phase-to-height mapping method, the measurement accuracy is affected by device attitude, so it needs saving a large amount of mapping equations to achieve high-quality phase-to-height mapping. In order to improve that, this paper proposes an improved phase-to-height mapping method combine with device attitude.
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View Article and Find Full Text PDFImproved algorithm for phase-to-height mapping in phase measuring profilometry.
Appl Opt
March 2012
Department of Opto-electronics Science and Technology, Sichuan University, Chengdu, China.
An improved algorithm for phase-to-height mapping in phase-measuring profilometry (PMP) is proposed, in which the phase-to-height mapping relationship is no longer restricted to the condition that the optical axes of the imaging system must be orthogonal to the reference plane in the basic PMP. Only seven coefficients independent of the coordinate system need to be calibrated, and the system calibration can be accomplished using only two different gauge blocks, instead of more than three different standard planes. With the proposed algorithm, both the phase measurement and system calibration can be completed simultaneously, which makes the three-dimensional (3-D) measurement faster and more flexible.
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