Chromatic aberration limits the resolution in spherical-aberration corrected Transmission Electron Microscopy to approximately 0.7Å at 300 kV. The energy spread in the beam is the main contribution to the chromatic aberration. This spread can be reduced with a monochromator. Another limitation to the resolution in TEM can be the finite brightness of the source and the consequent partial spatial coherence of the illumination. This limitation becomes important when spherical aberration and/or defocus are present such as in uncorrected TEM or in focal-series reconstruction in TEM. We used a monochromator optimized for minimum brightness loss and a prototype 'high-brightness' gun, and obtained brightness after monochromation comparable to that of the standard Schottky FEG before monochromation. The images were acquired on the prototype TEAM 0.5 microscope, which was developed on a Titan platform by increasing its electrical and mechanical stability.
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http://dx.doi.org/10.1016/j.ultramic.2012.01.008 | DOI Listing |
ACS Omega
January 2025
Department of Pharmaceutical Chemistry, College of Pharmacy, King Saud University, P.O. Box 2457, Riyadh 11451, Saudi Arabia.
Carbon dots (CDs) are emerging novel fluorescent sensing nanomaterials owing to their tunable optical properties, biocompatibility, and eco-friendliness. Herein, we report a facile one-pot hydrothermal route for the synthesis of highly green fluorescent CDs using gallic acid (GA) as a single carbon source in ,-dimethylformamide (DMF) solvent, which serves as a nitrogen source and reaction medium. The optical properties of the synthesized GA-DMF CDs were systematically characterized by using UV-vis and photoluminescence spectroscopy, revealing strong green fluorescence.
View Article and Find Full Text PDFTalanta
January 2025
Department of Physical and Analytical Chemistry, Faculty of Chemistry, University of Oviedo, C/ Julián Clavería 8, 33006, Oviedo, Spain; Health Research Institute of the Principality of Asturias (ISPA), Avda. Hospital Universitario s/n, 33011, Oviedo, Spain. Electronic address:
The use of inductively coupled plasma mass spectrometry in single particle mode (SP-ICP-MS) for the characterization of micro and nanostructured materials is a growing field of research. In this work, the possibility of expanding the boundaries to anisotropic structures including solid Pt-nanorods and hollowed FeO-nanotubes is presented. The obtained structures are evaluated by scanning electron microscopy (SEM), high-resolution electron microscopy (HR-TEM) and SP-ICP-MS techniques.
View Article and Find Full Text PDFMolecules
January 2025
Faculty of Food Science and Engineering, Kunming University of Science and Technology, Kunming 650500, China.
The use of biomass feedstocks for producing high-value-added chemicals is gaining significant attention in the academic community. In this study, near-infrared carbon dots (NIR-CDs) with antimicrobial and bioimaging functions were prepared from branches and leaves using a novel green synthesis approach. The spectral properties of the synthesized NIR-CDs were characterized by ultraviolet-visible (UV-Vis) absorption and fluorescence spectroscopy.
View Article and Find Full Text PDFNanomaterials (Basel)
January 2025
Department of Physical Science and Engineering, Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466-8555, Japan.
We present a versatile method for synthesizing high-quality molybdenum disulfide (MoS) crystals on graphite foil edges via chemical vapor deposition (CVD). This results in MoS/graphene heterostructures with precise epitaxial layers and no rotational misalignment, eliminating the need for transfer processes and reducing contamination. Utilizing in situ transmission electron microscopy (TEM) equipped with a nano-manipulator and tungsten probe, we mechanically induce the folding, wrinkling, and tearing of freestanding MoS crystals, enabling the real-time observation of structural changes at high temporal and spatial resolutions.
View Article and Find Full Text PDFMicron
January 2025
CEMES-CNRS, 29 Rue Jeanne Marvig, Toulouse 31055, France.
Owing to its high spatial resolution and its high sensitivity to chemical element detection, transmission electron microscopy (TEM) technique enables to address high-level materials characterization of advanced technologies in the microelectronics field. TEM instruments fitted with various techniques are well-suited for assessing the local structural and chemical order of specific details. Among these techniques, 4D-STEM is suitable to estimate the strain distribution of a large field of view.
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