The influence of the refractive index of air has proven to be a major problem on the road to improvement of the uncertainty in interferometric displacement measurements. We propose an approach with two counter-measuring interferometers acting as a combination of tracking refractometer and a displacement interferometer referencing the wavelength of the laser source to a mechanical standard made of a material with ultra-low thermal expansion. This technique combines length measurement within a specified range with measurement of the refractive index fluctuations in one axis. Errors caused by different position of the interferometer laser beam and air sensors are thus eliminated. The method has been experimentally tested in comparison with the indirect measurement of the refractive index of air in a thermal controlled environment. Over a 1 K temperature range an agreement on the level of 5 × 10(-8) has been achieved.
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http://dx.doi.org/10.3390/s110807644 | DOI Listing |
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View Article and Find Full Text PDFBiomed Opt Express
January 2025
Department of Biomedical Engineering, Case Western Reserve University, Cleveland, OH 44106, USA.
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View Article and Find Full Text PDFSmall Methods
January 2025
Institute of New Energy Technology, College of Physics & Optoelectronic Engineering, Jinan University, Guangzhou, Guangdong, 510632, China.
Flexible perovskite photovoltaic devices are typically constructed on flexible polyethylene naphthalate (PEN) substrates, which exhibit near-ultraviolet absorption and high visible-light reflection, leading to significant optical losses. To address this issue, a reusable optical-management sticker tailored for flexible substrates has been proposed in this work. The sticker incorporates a light-shifting material that converts near-ultraviolet light into visible light, enabling photoelectric conversion of near-ultraviolet light.
View Article and Find Full Text PDFBeilstein J Nanotechnol
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Department for Chemistry and Physics of Materials, University of Salzburg, Jakob-Haringer-Str. 2a, 5020 Salzburg, Austria.
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View Article and Find Full Text PDFSci Rep
January 2025
School of Microelectronics and Communication Engineering, Chongqing University, Chongqing, 400044, China.
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