Research on ultrafine particle size measurement using small amounts of data.

Appl Opt

School of Electric and Electronic Engineering, Shandong University of Technology, Zibo 255049, China.

Published: August 2011

The paper puts forward a new method of ultrafine particle size measurement using small amounts of data of a dynamic light-scattering signal, and establishes an arithmetic model of the measurement by wavelet package transform. First, through the wavelet package transform, the ultrafine particle dynamic light-scattering signals were decomposed into multifrequency bands. Then, the noise of signals of different frequency bands were removed and the power spectrum of the wavelet packet coefficients of each frequency band was calculated. Finally, the ultrafine particle size distribution information could be deduced from inversing the power spectrum. The standard polystyrene particles of 100, 300, and 400 nm were measured using this method, and the inversion results indicated that this method can effectively remove noise and improve the accuracy of particle size measurement using small amounts of data.

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Source
http://dx.doi.org/10.1364/AO.50.004855DOI Listing

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