[Boundary threshold value method used in crystalline material internal defect detection by short wavelength X-ray diffraction].

There are few references about crystalline material internal defect detected by X-ray diffraction tomography using common X-ray source. Short wavelength X-ray diffractometer (SWXRD), invented by Institute of Southwest Technology Engineering, is a relatively small and inexpensive instrument compared to synchrotron radiation or neutron reactor. Boundary determination of defect affects the imaging quality and the distinguishing of defect in X-ray diffraction tomography using SWXRD. In the present paper, threshold value method of diffracted intensity is put forward to process the test data, so the boundary of defect is legible. In order to study how the factors influence the threshold value, Gauss function is used in fitting the test data. The influence of varisized image quality indicator pressed in powdered aluminum on threshold value has been studied. The result shows that 91% of the diffraction intensity of substrate can be regarded as the threshold value. The experiment of slit in aluminum alloy sheet further verified the threshold value method. It's useful in detecting the defect boundary.