AI Article Synopsis
- The study utilizes small angle X-ray scattering (SAXS) to analyze the structure of vertically aligned multiwall carbon nanotube (MWCNT) arrays.
- By examining SAXS intensity at different angles, researchers assess the degree of alignment and identify two distinct morphologies across different heights of the CNT arrays.
- Findings indicate that the average diameter of the MWCNTs increases as one moves further away from the substrate, highlighting real variations in CNT sizes through model fitting.
Article Abstract
We have used small angle X-ray scattering (SAXS) to quantitatively characterize the morphology of vertically aligned (VA) multiwall carbon nanotube (MWCNT) arrays. We examined the extent of alignment of MWCNTs in terms of order parameter by analyzing SAXS intensity as a function of azimuthal angle. The SAXS measurements at different heights of CNT arrays from the substrate reveal two distinct morphologies and increasing alignment. We are able to quantitatively characterize a real variation in CNT diameters of the VA-MWCNTs through model fitting of the SAXS spectra. It found that the average CNT diameter increases with increasing distance from the substrate.
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| http://dx.doi.org/10.1166/jnn.2011.4110 | DOI Listing |
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