Amorphous carbon contamination monitoring and process optimization for single-walled carbon nanotube integration.

Nanotechnology

Micro and Nanosystems, ETH Zurich, 8092 Zurich, Switzerland.

Published: February 2007

We detail the monitoring of amorphous carbon deposition during thermal chemical vapour deposition of carbon nanotubes and propose a contamination-less process to integrate high-quality single-walled carbon nanotubes into micro-electromechanical systems. The amorphous content is evaluated by confocal micro-Raman spectroscopy and by scanning/transmission electron microscopy. We show how properly chosen process parameters can lead to successful integration of single-walled nanotubes, enabling nano-electromechanical system synthesis.

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Source
http://dx.doi.org/10.1088/0957-4484/18/7/075603DOI Listing

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