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Five-element Johann-type x-ray emission spectrometer with a single-photon-counting pixel detector. | LitMetric

AI Article Synopsis

  • A Johann-type spectrometer was developed with five spherically bent crystals and a pixel detector, covering Bragg angles from 60° to 88°.
  • It achieves high energy resolution from sub-eV to a few eV, with excellent calibration under 1.5 eV across all angles.
  • The device has a low concentration detection limit of below 0.4 wt% and is designed to be modular for integration into various hard x-ray synchrotron setups.

Article Abstract

A Johann-type spectrometer with five spherically bent crystals and a pixel detector was constructed for a range of hard x-ray photon-in photon-out synchrotron techniques, covering a Bragg-angle range of 60°-88°. The spectrometer provides a sub emission line width energy resolution from sub-eV to a few eV and precise energy calibration, better than 1.5 eV for the full range of Bragg angles. The use of a pixel detector allows fast and easy optimization of the signal-to-background ratio. A concentration detection limit below 0.4 wt% was reached at the Cu Kα(1) line. The spectrometer is designed as a modular mobile device for easy integration in a multi-purpose hard x-ray synchrotron beamline, such as the SuperXAS beamline at the Swiss Light Source.

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Source
http://dx.doi.org/10.1063/1.3600452DOI Listing

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