Here we report for the first time accurate and comprehensive measurements of electrical properties of individual CoPt/Pt multilayer nanowires both with periodic and non-periodic layer structures. A remarkably high failure current density of 1.69 × 10(12) A m(-2) for the periodic MNW and a similar 1.76 × 10(12) A m(-2) for the non-homogeneous MNW has been measured. The resistance of both types of multilayer nanowire structures are well fitted by a series resistance model, determining the separate resistance contribution of the component layers and magnetic/nonmagnetic interfaces for a single multilayer nanowire. The field-dependent interface resistance of both samples is calculated, 13.2 Ω for periodic layer structures and 4.84 Ω for non-periodic layer structures. The clear physical picture of the resistance distribution within individual multilayer nanowires is then determined. The accurate electrical testing of magnetic multilayer nanowires provides basic and necessary electrical parameters for their usage as building blocks or interconnects in nanoelectronics and nanosensors.
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