We report on the experimental demonstration and analysis of a new waveguide principle using subwavelength gratings. Unlike other periodic waveguides such as line-defects in a 2D photonic crystal lattice, a subwavelength grating waveguide confines the light as a conventional index-guided structure and does not exhibit optically resonant behaviour. Subwavelength grating waveguides in silicon-on-insulator are fabricated with a single etch step and allow for flexible control of the effective refractive index of the waveguide core simply by lithographic patterning. Experimental measurements indicate a propagation loss as low as 2.1 dB/cm for subwavelength grating waveguides with negligible polarization and wavelength dependent loss, which compares favourably to conventional microphotonic silicon waveguides. The measured group index is nearly constant n(g) ~1.5 over a wavelength range exceeding the telecom C-band.
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http://dx.doi.org/10.1364/OE.18.020251 | DOI Listing |
Sci Rep
December 2024
Physical Research Laboratory, Ahmedabad, Gujarat, 380009, India.
Talbot length, the distance between two consecutive self-image planes along the propagation axis for a periodic diffraction object (grating) illuminated by a plane wave, depends on the period of the object and the wavelength of illumination. This property makes the Talbot effect a straightforward technique for measuring the period of a periodic object (grating) by accurately determining the Talbot length for a given illumination wavelength. However, since the Talbot length scale is proportional to the square of the grating period, traditional Talbot techniques face challenges when dealing with smaller grating periods and minor changes in the grating period.
View Article and Find Full Text PDFInverse design (ID) is a computational method that systematically explores a design space to find optimal device geometries based on specific performance criteria. In silicon photonics, ID often generates design features that degrade significantly due to the fabrication process, limiting the applicability of these devices in scalable fabrication. We demonstrate a solution to this performance degradation through fabrication-aware inverse design (FAID), integrating lithography models for deep-ultraviolet (DUV) lithography and electron-beam lithography (EBL) into the shape optimization approach of ID.
View Article and Find Full Text PDFNanomaterials (Basel)
November 2024
Department of Electro-Optical Engineering, National Taipei University of Technology, Taipei 106, Taiwan.
A small amount of silver was obliquely deposited onto a polymer subwavelength grating to form a metasurface that comprised silver split-tubes. An ultra-thin silver film with a monitor-controlled thickness of 20 nm at the corner of each ridge of the grating provided the most sensitive surface-enhanced Raman scattering (SERS) measurements. An excitation laser beam that was incident from the substrate provided similar or better SERS enhancement than did the general configuration with the laser beam incident directly on the surface of the nanostructure.
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