We introduce a new kind of light field to improve and simplify the trapping process of axially displaced particles. To this end we employ a light field with an axially expanded intensity distribution, which at the same time enables stable axial trapping. We present simulations of the axial intensity distribution of the novel trapping field and first experimental results, which demonstrate the improvement of the reliability of the axial trapping process. The method can be used to automate trapping of particles that are located outside of the focal plane of the microscope.
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http://dx.doi.org/10.1364/OE.18.019941 | DOI Listing |
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