Simultaneous line center and linewidth measurement using dual frequency modulation spectroscopy.

Appl Opt

MIT–Harvard Center for Ultracold Atoms, Research Laboratory of Electronics, and Department of Physics, Massachusetts Institute of Technology, Cambridge Massachusetts 02139, USA.

Published: October 2010

We propose a method to simultaneously measure the center frequency of a spectral feature and the frequency linewidth of the feature. The method relies on dual frequency modulation of a carrier frequency, which probes the spectral feature, and phase sensitive detection of the transmitted signal at the two modulation frequencies. The detected signals provide two servo-stabilization signals for frequency control of the carrier frequency to the resonance line center and one of the modulation frequencies to the resonance linewidth.

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Source
http://dx.doi.org/10.1364/AO.49.005528DOI Listing

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