Severity: Warning
Message: file_get_contents(https://...@pubfacts.com&api_key=b8daa3ad693db53b1410957c26c9a51b4908&a=1): Failed to open stream: HTTP request failed! HTTP/1.1 429 Too Many Requests
Filename: helpers/my_audit_helper.php
Line Number: 176
Backtrace:
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 176
Function: file_get_contents
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 250
Function: simplexml_load_file_from_url
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 1034
Function: getPubMedXML
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 3152
Function: GetPubMedArticleOutput_2016
File: /var/www/html/application/controllers/Detail.php
Line: 575
Function: pubMedSearch_Global
File: /var/www/html/application/controllers/Detail.php
Line: 489
Function: pubMedGetRelatedKeyword
File: /var/www/html/index.php
Line: 316
Function: require_once
Imaging and sensing applications based on pulsed terahertz radiation have opened new possibilities for scientific and industrial applications. Many exploit the unique features of the terahertz (THz) spectral region, where common packaging materials are transparent and many chemical compounds show characteristic absorptions. Because of their diffraction limit, THz far-field imaging techniques lack microscopic resolution and, if subwavelength features have to be resolved, near-field techniques are required. Here, we present a THz near-field microscopy approach based on photoconductive antennas as the THz emitter and as a near-field probe. Our system allows us to measure amplitude, phase, and polarization of the electric fields in the vicinity of a sample with a spatial resolution on the micrometer scale (approximately lambda/20). Using a dielectric (plant leaf) and a metallic structure (microwire) as examples, we demonstrate the capabilities of our approach.
Download full-text PDF |
Source |
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http://dx.doi.org/10.1364/AO.49.0000E1 | DOI Listing |
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